Paper Title:
Scanning Thermo Probe Technique - A Method for High Resolution Characterization of Graded Semiconductors and Metals
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 308-311)
Edited by
W.A. Kaysser
Pages
890-895
DOI
10.4028/www.scientific.net/MSF.308-311.890
Citation
P. Reinshaus, H. Süßmann, G. Erz, U. Kramer, W. Heiliger, "Scanning Thermo Probe Technique - A Method for High Resolution Characterization of Graded Semiconductors and Metals", Materials Science Forum, Vols. 308-311, pp. 890-895, 1999
Online since
May 1999
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