Paper Title:
EXAFS Study of Defect Clusters of Highly Er3+ Doped CaF2 Thin Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 315-317)
Main Theme
Edited by
R.C. Woodward
Pages
394-399
DOI
10.4028/www.scientific.net/MSF.315-317.394
Citation
T. Césaire, L. Hirsch, B. Porté, A.S. Barrière, "EXAFS Study of Defect Clusters of Highly Er3+ Doped CaF2 Thin Films", Materials Science Forum, Vols. 315-317, pp. 394-399, 1999
Online since
July 1999
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Price
$32.00
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