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European Powder Diffraction 6

Materials Science Forum Volumes 321 - 324

• Papers
• Abstracts

• p1 Long Standing Problems in Organometallic Chemistry Solved by Powder Diffraction   [ 804 K ]
  Authors: R.E. Dinnebier
• p14 Resolution Enhancement: What Does Deconvolution Offer?   [ 600 K ]
  Authors: D. Reefman
• p22 Powder Pattern Decomposition with the Aid of Preferred Orientation - Experimental Test   [ 285 K ]
  Authors: R. Černý
• p28 Anisotropic Line Broadening from Stacking Faults in Rietveld Refinement   [ 263 K ]
  Authors: L.A. Solovyov
• p34 Molecular Modelling Features in XPD Rietveld Refinement of Organic Structures   [ 214 K ]
  Authors: P. Friedel, J. Bergmann
• p40 Towards the Solution of Organic Crystal Structures by Powder Diffraction   [ 294 K ]
  Authors: S. Pagola, P.W. Stephens
• p46 Powder and Single-Crystal X-Ray Structural Refinement on a Natural Chromite: Dependence of Site Occupancies on Experimental Strategies   [ 347 K ]
  Authors: G. Salviulo, S. Carbonin, A. Della Giusta
• p54 Quantitative Phase Analysis: Rietveld Method Versus Full-Pattern Method with Whole Observed Standard Profiles   [ 226 K ]
  Authors: E. Halwax, L. Petrás
• p60 Quantitative Analysis of Energetic Materials with X-Ray Diffraction and Rietveld Refinement   [ 129 K ]
  Authors: Mathias Herrmann, W. Engel
• p66 Analysis of Residual Stress States   [ 671 K ]
  Authors: Walter Reimers
• p75 X-Ray Residual Stress Gradient Analysis under Difficult Conditions - Attempts for Improving Solution   [ 291 K ]
  Authors: Christoph Genzel, Walter Reimers
• p81 X-Ray Analysis of Residual Stresses and Stress-Free Lattice Parameters in Thin Gradient Coatings   [ 355 K ]
  Authors: T. Dümmer, B. Eigenmann, Detlef Löhe
• p87 Extinction Study of Dislocations (Bragg Diffraction)   [ 234 K ]
  Authors: A.N. Ivanov, P. Klimanek, A.M. Polyakov
• p92 Characterisation of Dislocation Types in a Plastically Deformed Aluminium Base Alloy   [ 214 K ]
  Authors: Erhard Schafler, Ch. Sitkovitch, Iuliana C. Dragomir, Ádám Révész, Michael J. Zehetbauer, Tamás Ungár
• p97 Calculation of Diffraction Patterns of Close-Packed Polytypes with Random Shearing Stacking Faults   [ 299 K ]
  Authors: E.V. Shelekhov, T.A. Sviridova