Paper Title:
XRD and Optical Characterisation of GaN and Associated Substrate Materials
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
1056-1061
DOI
10.4028/www.scientific.net/MSF.321-324.1056
Citation
E.B. Fantner, T. Ryan, M. Schurman, I. T. Ferguson, "XRD and Optical Characterisation of GaN and Associated Substrate Materials", Materials Science Forum, Vols. 321-324, pp. 1056-1061, 2000
Online since
January 2000
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Price
$32.00
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