Paper Title:
X-Ray Diffraction Method of Grain Size Measurement
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
133-136
DOI
10.4028/www.scientific.net/MSF.321-324.133
Citation
Y.D. Yagodkin, G.V. Vekilova, R.S. Mungalov, "X-Ray Diffraction Method of Grain Size Measurement", Materials Science Forum, Vols. 321-324, pp. 133-136, 2000
Online since
January 2000
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Price
$32.00
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