Paper Title:
Neutron Reflectivity, a Tool for Thin Film Characterization
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
246-257
DOI
10.4028/www.scientific.net/MSF.321-324.246
Citation
A. Menelle, "Neutron Reflectivity, a Tool for Thin Film Characterization", Materials Science Forum, Vols. 321-324, pp. 246-257, 2000
Online since
January 2000
Authors
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.