Paper Title:
Evaluation of High-Resolution SANS Measurements in Multiple Scattering Regime
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
270-275
DOI
10.4028/www.scientific.net/MSF.321-324.270
Citation
J. Šaroun, P. Strunz, S. Borbély, J. Ilavský, B. Kolman, "Evaluation of High-Resolution SANS Measurements in Multiple Scattering Regime", Materials Science Forum, Vols. 321-324, pp. 270-275, 2000
Online since
January 2000
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Price
$32.00
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