Anisotropic Line Broadening from Stacking Faults in Rietveld Refinement |
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| Journal | Materials Science Forum (Volumes 321 - 324) |
|---|---|
| Volume | European Powder Diffraction 6 |
| Edited by | R. Delhez, E.J. Mittemeijer |
| Pages | 28-33 |
| DOI | 10.4028/www.scientific.net/MSF.321-324.28 |
| Citation | L.A. Solovyov, 2000, Materials Science Forum, 321-324, 28 |
| Authors | L.A. Solovyov |
| Keywords | Line Broadening, Rietveld Analysis, Stacking Fault |
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