Paper Title:
X-Ray Characterization of LPOMVPE Grown AlAs/GaAs Multilayer
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
445-450
DOI
10.4028/www.scientific.net/MSF.321-324.445
Citation
D. Mogilyanski, M. Blumin, E. Gartstein, R. Opitz, R. Kohler, "X-Ray Characterization of LPOMVPE Grown AlAs/GaAs Multilayer", Materials Science Forum, Vols. 321-324, pp. 445-450, 2000
Online since
January 2000
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Price
$32.00
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