Paper Title:
Characterization of Ni80Fe20/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering
  Abstract

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Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
451-456
DOI
10.4028/www.scientific.net/MSF.321-324.451
Citation
D.C. Meyer, K. Richter, B. Wehner, G. Reiss, L. van Loyen, P. Paufler, "Characterization of Ni80Fe20/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering", Materials Science Forum, Vols. 321-324, pp. 451-456, 2000
Online since
January 2000
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