Paper Title:
Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
457-462
DOI
10.4028/www.scientific.net/MSF.321-324.457
Citation
K. Frohberg, B. Wehner, B. Trui, K. Wolf, P. Paufler, H. Kück, "Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods", Materials Science Forum, Vols. 321-324, pp. 457-462, 2000
Online since
January 2000
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Price
$32.00
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