Paper Title:
Quantitative Analysis of Energetic Materials with X-Ray Diffraction and Rietveld Refinement
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 321-324)
Edited by
R. Delhez, E.J. Mittemeijer
Pages
60-65
DOI
10.4028/www.scientific.net/MSF.321-324.60
Citation
M. Herrmann, W. Engel, "Quantitative Analysis of Energetic Materials with X-Ray Diffraction and Rietveld Refinement", Materials Science Forum, Vols. 321-324, pp. 60-65, 2000
Online since
January 2000
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Price
$32.00
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