X-Ray Residual Stress Gradient Analysis under Difficult Conditions - Attempts for Improving Solution |
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| Journal | Materials Science Forum (Volumes 321 - 324) |
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| Volume | European Powder Diffraction 6 |
| Edited by | R. Delhez, E.J. Mittemeijer |
| Pages | 75-80 |
| DOI | 10.4028/www.scientific.net/MSF.321-324.75 |
| Citation | Christoph Genzel et al., 2000, Materials Science Forum, 321-324, 75 |
| Authors | Christoph Genzel, Walter Reimers |
| Keywords | Residual Stress Gradients, Surface Processing, Texture, Thin Film |
| Full Paper | 
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