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Calculation of Diffraction Patterns of Close-Packed Polytypes with Random Shearing Stacking Faults

Journal Materials Science Forum (Volumes 321 - 324)
Volume European Powder Diffraction 6
Edited by R. Delhez, E.J. Mittemeijer
Pages 97-102
DOI 10.4028/www.scientific.net/MSF.321-324.97
Citation E.V. Shelekhov et al., 2000, Materials Science Forum, 321-324, 97
Authors E.V. Shelekhov, T.A. Sviridova
Keywords Polytype, Simulation of X-Ray Pattern, Stacking Fault
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