Crystal Structure Determination of Y2SiAIO5N 'B-Phase' by Rietveld Analysis |
| Journal |
Materials Science Forum (Volumes 325 - 326) |
| Volume |
Nitrides and Oxynitrides |
| Edited by |
S. Hampshire, M.J. Pomeroy |
| Pages |
325-334 |
| DOI |
10.4028/www.scientific.net/MSF.325-326.325 |
| Citation |
M.F. Gonon et al., 2000, Materials Science Forum, 325-326, 325 |
| Authors |
M.F. Gonon, Jean-Claude Descamps, F. Cambier, Derek P. Thompson |
| Keywords |
B-Phase, Crystal Structure, Rietveld X-Ray Analysis, Y-SiAlON |
| Full Paper |
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