Paper Title:
Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions
  Abstract

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Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
1017-1020
DOI
10.4028/www.scientific.net/MSF.338-342.1017
Citation
K. Vassilevski, K. Zekentes, G. Konstantinidis, N. Papanicolaou, I. P. Nikitina, A.I. Babanin, "Structural and Morphological Characterization of Al/Ti-Based Ohmic Contacts on p-Type 4H-SiC Annealed Under Various Conditions", Materials Science Forum, Vols. 338-342, pp. 1017-1020, 2000
Online since
May 2000
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Price
$35.00
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