Paper Title:
The Effect of In Situ Surface Treatment on the Growth of 3C-SiC Thin Films on 6H-SiC Substrate - An X-ray Triple Crystal Diffractometry and Synchrotron X-ray Topography Study
  Abstract

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Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
1045-1048
DOI
10.4028/www.scientific.net/MSF.338-342.1045
Citation
J. Chaudhuri, J.T. George, J.H. Edgar, Z. Y. Xie, Z. Rek, "The Effect of In Situ Surface Treatment on the Growth of 3C-SiC Thin Films on 6H-SiC Substrate - An X-ray Triple Crystal Diffractometry and Synchrotron X-ray Topography Study", Materials Science Forum, Vols. 338-342, pp. 1045-1048, 2000
Online since
May 2000
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Price
$32.00
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