Paper Title:
Performance and Reliability Issues of SiC-Schottky Diodes
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
1167-1170
DOI
10.4028/www.scientific.net/MSF.338-342.1167
Citation
R. Rupp, M. Treu, A. Mauder, E. Griebl, W. Werner, W. Bartsch, D. Stephani, "Performance and Reliability Issues of SiC-Schottky Diodes", Materials Science Forum, Vols. 338-342, pp. 1167-1170, 2000
Online since
May 2000
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Price
$32.00
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