Paper Title:
Characterization of SiC MESFETs on Conducting Substrates
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
1255-1258
DOI
10.4028/www.scientific.net/MSF.338-342.1255
Citation
P. Å. Nilsson, A.M. Saroukhan, J.O. Svedberg, A. O. Konstantinov, S. Karlsson, C. Adås, U. Gustafsson, C. I. Harris, N. Rorsman, J. Eriksson, H. Zirath, "Characterization of SiC MESFETs on Conducting Substrates", Materials Science Forum, Vols. 338-342, pp. 1255-1258, 2000
Online since
May 2000
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Price
$32.00
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