Paper Title:

Analysis of Dislocation Densities and Nanopipe Formation in MBE-grown AlN-Layers

Periodical Materials Science Forum (Volumes 338 - 342)
Main Theme Silicon Carbide and Related Materials - 1999
Edited by Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages 1549-1552
DOI 10.4028/www.scientific.net/MSF.338-342.1549
Citation D.G. Ebling et al., 2000, Materials Science Forum, 338-342, 1549
Authors D.G. Ebling, L. Kirste, M. Rattunde, J. Portmann, R. Brenn, K.W. Benz, K. Tillmann
Keywords Atomic Force Microscope (AFM), Nanopipes, RBS/Channeling, SiC Substrates, Spiral Growth, X-Ray Diffraction (XRD)
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