Paper Title:
Analysis of Dislocation Densities and Nanopipe Formation in MBE-grown AlN-Layers
| Periodical |
Materials Science Forum (Volumes 338 - 342)
|
| Main Theme |
Silicon Carbide and Related Materials - 1999
|
| Edited by |
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer |
| Pages |
1549-1552 |
| DOI |
10.4028/www.scientific.net/MSF.338-342.1549 |
| Citation |
D.G. Ebling et al., 2000, Materials Science Forum, 338-342, 1549 |
| Authors |
D.G. Ebling, L. Kirste, M. Rattunde, J. Portmann, R. Brenn, K.W. Benz, K. Tillmann |
| Keywords |
Atomic Force Microscope (AFM), Nanopipes, RBS/Channeling, SiC Substrates, Spiral Growth, X-Ray Diffraction (XRD) |
| Price |
US$ 28,- |