Paper Title:
Characterization of Thick GaN Layers Using Guided Optical Waves
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
1583-1586
DOI
10.4028/www.scientific.net/MSF.338-342.1583
Citation
D. Ciplys, R. Rimeika, M. Asif Khan, J.W. Yang, R. Gaska, M. S. Shur, "Characterization of Thick GaN Layers Using Guided Optical Waves", Materials Science Forum, Vols. 338-342, pp. 1583-1586, 2000
Online since
May 2000
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Price
$32.00
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