Status of Large Diameter SiC Crystal Growth for Electronic and Optical Applications |
| Journal |
Materials Science Forum (Volumes 338 - 342) |
| Volume |
Silicon Carbide and Related Materials - 1999 |
| Edited by |
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer |
| Pages |
3-8 |
| DOI |
10.4028/www.scientific.net/MSF.338-342.3 |
| Citation |
H. McD. Hobgood et al., 2000, Materials Science Forum, 338-342, 3 |
| Authors |
H. McD. Hobgood, M.F. Brady, W.H. Brixius, G. Fechko, R.C. Glass, D. Henshall, Jason R. Jenny, R.T. Leonard, D.P. Malta, Stephan G. Müller, Valeri F. Tsvetkov, Calvin H. Carter Jr. |
| Keywords |
Absorption, Defect, Micropipe, Purity, Resistivity, Substrate, Thermal Conductivity (TC) |
| Full Paper |
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