Paper Title:
Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
353-356
DOI
10.4028/www.scientific.net/MSF.338-342.353
Citation
J.D. Hartman, K. Naniwae, C. Petrich, V. Ramachandran, R.M. Feenstra, R. J. Nemanich, R. F. Davis, "Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)", Materials Science Forum, Vols. 338-342, pp. 353-356, 2000
Online since
May 2000
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