Paper Title:
Electronic and Atomic Structure of an Ordered Silicate Adlayer on Hexagonal SiC
| Periodical |
Materials Science Forum (Volumes 338 - 342)
|
| Main Theme |
Silicon Carbide and Related Materials - 1999
|
| Edited by |
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer |
| Pages |
387-390 |
| DOI |
10.4028/www.scientific.net/MSF.338-342.387 |
| Citation |
M. Hollering et al., 2000, Materials Science Forum, 338-342, 387 |
| Authors |
M. Hollering, N. Sieber, F. Maier, Jürgen Ristein, Lothar Ley, J.D. Riley, R.C.G. Leckey, F. Leisenberger, F. Netzer |
| Keywords |
Angle Resolved Photoelectron Spectroscopy, Silicon Oxide (SiO), Surface States, X-Ray Induced Photoelectron Spectroscopy |
| Price |
US$ 28,- |