Paper Title:

Electronic and Atomic Structure of an Ordered Silicate Adlayer on Hexagonal SiC

Periodical Materials Science Forum (Volumes 338 - 342)
Main Theme Silicon Carbide and Related Materials - 1999
Edited by Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages 387-390
DOI 10.4028/www.scientific.net/MSF.338-342.387
Citation M. Hollering et al., 2000, Materials Science Forum, 338-342, 387
Authors M. Hollering, N. Sieber, F. Maier, Jürgen Ristein, Lothar Ley, J.D. Riley, R.C.G. Leckey, F. Leisenberger, F. Netzer
Keywords Angle Resolved Photoelectron Spectroscopy, Silicon Oxide (SiO), Surface States, X-Ray Induced Photoelectron Spectroscopy
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