Paper Title:
Characterization of SiC using Synchrotron White Beam X-ray Topography
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
431-436
DOI
10.4028/www.scientific.net/MSF.338-342.431
Citation
M. Dudley, X. Huang, "Characterization of SiC using Synchrotron White Beam X-ray Topography", Materials Science Forum, Vols. 338-342, pp. 431-436, 2000
Online since
May 2000
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Price
$32.00
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