Paper Title:
Synchrotron White Beam Topography Studies of 2H SiC Crystals
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
465-468
DOI
10.4028/www.scientific.net/MSF.338-342.465
Citation
M. Dudley, W. Huang, W. M. Vetter, P. G. Neudeck, J. A. Powell, "Synchrotron White Beam Topography Studies of 2H SiC Crystals", Materials Science Forum, Vols. 338-342, pp. 465-468, 2000
Online since
May 2000
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Price
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