Paper Title:
Investigation of Low Angle Grain Boundaries in Modified-Lely SiC Crystals by High Resolution X-ray Diffractometry
  Abstract

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Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
493-496
DOI
10.4028/www.scientific.net/MSF.338-342.493
Citation
M. Katsuno, N. Ohtani, T. Aigo, H. Yashiro, M. Kanaya, "Investigation of Low Angle Grain Boundaries in Modified-Lely SiC Crystals by High Resolution X-ray Diffractometry", Materials Science Forum, Vols. 338-342, pp. 493-496, 2000
Online since
May 2000
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