Paper Title:
Anisotropic Dielectric Function Properties of Semi-insulating 4H-SiC Determined from Spectroscopic Ellipsometry
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
571-574
DOI
10.4028/www.scientific.net/MSF.338-342.571
Citation
M. Kildemo, M.B. Mooney, P.V. Kelly, C. Sudre, G.M. Crean, "Anisotropic Dielectric Function Properties of Semi-insulating 4H-SiC Determined from Spectroscopic Ellipsometry", Materials Science Forum, Vols. 338-342, pp. 571-574, 2000
Online since
May 2000
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