Paper Title:
Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
595-598
DOI
10.4028/www.scientific.net/MSF.338-342.595
Citation
S. Rohmfeld, M. Hundhausen, L. Ley, C. A. Zorman, M. Mehregany, "Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si", Materials Science Forum, Vols. 338-342, pp. 595-598, 2000
Online since
May 2000
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.