Paper Title:
Raman Imaging Characterization of Electric Properties of SiC Near a Micropipe
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
603-606
DOI
10.4028/www.scientific.net/MSF.338-342.603
Citation
H. Harima, T. Hosoda, S. Nakashima, "Raman Imaging Characterization of Electric Properties of SiC Near a Micropipe", Materials Science Forum, Vols. 338-342, pp. 603-606, 2000
Online since
May 2000
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Price
$32.00
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