Paper Title:
Confocal Raman Microprobe of Lattice Damage in N+ Implanted 6H-SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
663-666
DOI
10.4028/www.scientific.net/MSF.338-342.663
Citation
N. Mestres, F. Alsina, F.J. Campos, J. Pascual, E. Morvan, P. Godignon, J. Millan, "Confocal Raman Microprobe of Lattice Damage in N+ Implanted 6H-SiC", Materials Science Forum, Vols. 338-342, pp. 663-666, 2000
Online since
May 2000
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.