Paper Title:
Optical Lifetime Measurements in 4H SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
679-682
DOI
10.4028/www.scientific.net/MSF.338-342.679
Citation
Y. Shishkin, R. P. Devaty, W. J. Choyke, "Optical Lifetime Measurements in 4H SiC", Materials Science Forum, Vols. 338-342, pp. 679-682, 2000
Online since
May 2000
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Price
$32.00
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