Paper Title:
Optical Characterization of 4H-SiC p+n-n+ Structures Applying Time- and Spectrally Resolved Emission Microscopy
  Abstract

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Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
683-686
DOI
10.4028/www.scientific.net/MSF.338-342.683
Citation
A. Galeckas, J. Linnros, B. Breitholtz, "Optical Characterization of 4H-SiC p+n-n+ Structures Applying Time- and Spectrally Resolved Emission Microscopy", Materials Science Forum, Vols. 338-342, pp. 683-686, 2000
Online since
May 2000
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