Paper Title:
MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
707-710
DOI
10.4028/www.scientific.net/MSF.338-342.707
Citation
M. Chafai, J. Jiménez, E. Martín, W.C. Mitchel, A. W. Saxler, R. Perrin, "MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC", Materials Science Forum, Vols. 338-342, pp. 707-710, 2000
Online since
May 2000
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Price
$32.00
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