Paper Title:
Theoretical Study of Carrier Freeze-Out Effects on Admittance Spectroscopy and Frequency-Dependent C-V Measurements in SiC
  Abstract

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Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
745-748
DOI
10.4028/www.scientific.net/MSF.338-342.745
Citation
A.V. Los, M. S. Mazzola, S. E. Saddow, "Theoretical Study of Carrier Freeze-Out Effects on Admittance Spectroscopy and Frequency-Dependent C-V Measurements in SiC", Materials Science Forum, Vols. 338-342, pp. 745-748, 2000
Online since
May 2000
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Price
$32.00
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