Paper Title:
Measurement of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Power Diodes
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 338-342)
Edited by
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer
Pages
781-784
DOI
10.4028/www.scientific.net/MSF.338-342.781
Citation
A. Udal, E. Velmre, "Measurement of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Power Diodes", Materials Science Forum, Vols. 338-342, pp. 781-784, 2000
Online since
May 2000
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.