Adhesion and Microstructure of Ni Contacts to 3C-SiC |
| Journal |
Materials Science Forum (Volumes 338 - 342) |
| Volume |
Silicon Carbide and Related Materials - 1999 |
| Edited by |
Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer |
| Pages |
993-996 |
| DOI |
10.4028/www.scientific.net/MSF.338-342.993 |
| Citation |
Soo Chang Kang et al., 2000, Materials Science Forum, 338-342, 993 |
| Authors |
Soo Chang Kang, Moo Whan Shin |
| Keywords |
Adhesion, Interface, Ohmic Contact, Scratch Test, X-Ray Scattering |
| Full Paper |
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