Paper Title:

Micro-Area Residual Stress Measurement Using a Two-Dimensional Detector

Periodical Materials Science Forum (Volumes 347 - 349)
Main Theme Residual Stress ECRS 5
Edited by A.J. Böttger, R. Delhez and E.J. Mittemeijer
Pages 101-106
DOI 10.4028/www.scientific.net/MSF.347-349.101
Citation Bob B. He et al., 2000, Materials Science Forum, 347-349, 101
Authors Bob B. He, Kingsley L. Smith, Uwe Preckwinkel, Willard schultz
Keywords Area Detector, Large Grain, Microdiffraction, Residual Stress, Sample Alignment, Textured Sample, Two-Dimensional X-Ray Diffraction, Virtual Oscillation
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