Paper Title:
Micro-Area Residual Stress Measurement Using a Two-Dimensional Detector
| Periodical |
Materials Science Forum (Volumes 347 - 349)
|
| Main Theme |
Residual Stress ECRS 5
|
| Edited by |
A.J. Böttger, R. Delhez and E.J. Mittemeijer |
| Pages |
101-106 |
| DOI |
10.4028/www.scientific.net/MSF.347-349.101 |
| Citation |
Bob B. He et al., 2000, Materials Science Forum, 347-349, 101 |
| Authors |
Bob B. He, Kingsley L. Smith, Uwe Preckwinkel, Willard schultz |
| Keywords |
Area Detector, Large Grain, Microdiffraction, Residual Stress, Sample Alignment, Textured Sample, Two-Dimensional X-Ray Diffraction, Virtual Oscillation |
| Price |
US$ 28,- |