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Determination of Alignment Errors in Classical XRD Residual Stress Methods

Journal Materials Science Forum (Volumes 347 - 349)
Volume Residual Stress ECRS 5
Edited by A.J. Böttger, R. Delhez and E.J. Mittemeijer
Pages 17-22
DOI 10.4028/www.scientific.net/MSF.347-349.17
Citation Arnold C. Vermeulen et al., 2000, Materials Science Forum, 347-349, 17
Authors Arnold C. Vermeulen, E. Houtman
Keywords Accuracy, Alignment Errors, Residual Stress, Stress-Free Sample, X-Ray Diffraction (XRD)
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