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Observations on two Commonly Used Profile Shape Functions

Journal Materials Science Forum (Volumes 347 - 349)
Volume Residual Stress ECRS 5
Edited by A.J. Böttger, R. Delhez and E.J. Mittemeijer
Pages 23-28
DOI 10.4028/www.scientific.net/MSF.347-349.23
Authors Bruno Courant, B. Bourniquel, Manuel François, M. Bessière
Keywords Goodness of Fit Criterion, Pearson Vll Function, Profile Fitting, Pseudo-Voigt Function, Thermal Diffuse Scattering, Variance of a Diffraction Line, Variance Stabilization
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