Stress in Thin Layers; Grain Interaction, Elastic Constants and Diffraction Response |
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| Journal | Materials Science Forum (Volumes 347 - 349) |
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| Volume | Residual Stress ECRS 5 |
| Edited by | A.J. Böttger, R. Delhez and E.J. Mittemeijer |
| Pages | 42-47 |
| DOI | 10.4028/www.scientific.net/MSF.347-349.42 |
| Authors | Jan-Dirk Kamminga, Matteo Leoni, U. Welzel, P. Lamparter, Eric J. Mittemeijer |
| Keywords | Elastic Constant, Stress, Thin Film, X-Ray Diffraction (XRD) |
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