Stress in Thin Layers; Grain Interaction, Elastic Constants and Diffraction Response |
| Journal |
Materials Science Forum (Volumes 347 - 349) |
| Volume |
Residual Stress ECRS 5 |
| Edited by |
A.J. Böttger, R. Delhez and E.J. Mittemeijer |
| Pages |
42-47 |
| DOI |
10.4028/www.scientific.net/MSF.347-349.42 |
| Citation |
Jan-Dirk Kamminga et al., 2000, Materials Science Forum, 347-349, 42 |
| Authors |
Jan-Dirk Kamminga, Matteo Leoni, U. Welzel, P. Lamparter, Eric J. Mittemeijer |
| Keywords |
Elastic Constant, Stress, Thin Film, X-Ray Diffraction (XRD) |
| Full Paper |
Get the full paper by clicking here
|
