A New Approach to Evaluate Steep Stress Gradients Principally Using Layer Removal |
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| Journal | Materials Science Forum (Volumes 347 - 349) |
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| Volume | Residual Stress ECRS 5 |
| Edited by | A.J. Böttger, R. Delhez and E.J. Mittemeijer |
| Pages | 80-82 |
| DOI | 10.4028/www.scientific.net/MSF.347-349.80 |
| Citation | V. Hauk et al., 2000, Materials Science Forum, 347-349, 80 |
| Authors | V. Hauk, B. Krüger |
| Keywords | Information Depth, Stress Gradients, Thin Layer Removal Technique |
| Full Paper | 
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