Paper Title:

Analysis of Strain and Defect Formation of Low-Dimensional Structures in SiC

Periodical Materials Science Forum (Volumes 353 - 356)
Main Theme Silicon Carbide and Related Materials 2000
Edited by G. Pensl, D. Stephani and M. Hundhausen
Pages 259-262
DOI 10.4028/www.scientific.net/MSF.353-356.259
Citation Ute Kaiser et al., 2001, Materials Science Forum, 353-356, 259
Authors Ute Kaiser, K. Saitoh, A. Chuvilin
Keywords Defect Formation, Implantation, MBE Growth, Silicon Carbide (SiC), Strain, TEM
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