Paper Title:
X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 353-356)
Edited by
G. Pensl, D. Stephani and M. Hundhausen
Pages
283-286
DOI
10.4028/www.scientific.net/MSF.353-356.283
Citation
E. Pernot, M. Mermoux, J. Kreisel, O. Chaix-Pluchery, P. Pernot-Rejmánková, M. Anikin, B. Pelissier, A.M. Glazer, R. Madar, "X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide", Materials Science Forum, Vols. 353-356, pp. 283-286, 2001
Online since
January 2001
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Price
$32.00
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