Paper Title:
Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals
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Periodical
Materials Science Forum (Volumes 353-356)
Edited by
G. Pensl, D. Stephani and M. Hundhausen
Pages
319-322
DOI
10.4028/www.scientific.net/MSF.353-356.319
Citation
J. Kräußlich, A. J. Bauer, B. Wunderlich, K. Goetz, "Lattice Parameter Measurements of 3C-SiC Thin Films Grown on 6H-SiC(0001) Substrate Crystals", Materials Science Forum, Vols. 353-356, pp. 319-322, 2001
Online since
January 2001
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