Paper Title:
Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 353-356)
Edited by
G. Pensl, D. Stephani and M. Hundhausen
Pages
393-396
DOI
10.4028/www.scientific.net/MSF.353-356.393
Citation
L. Masarotto, J. M. Bluet, M. Berenguer, P. Girard, G. Guillot, "Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy", Materials Science Forum, Vols. 353-356, pp. 393-396, 2001
Online since
January 2001
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Price
$32.00
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