Paper Title:
Tantalum and Tungsten in Silicon Carbide: Identification and Polytype Dependence of Deep Levels
| Periodical | Materials Science Forum (Volumes 353 - 356) |
|---|---|
| Main Theme | Silicon Carbide and Related Materials 2000 |
| Edited by | G. Pensl, D. Stephani and M. Hundhausen |
| Pages | 475-478 |
| DOI | 10.4028/www.scientific.net/MSF.353-356.475 |
| Citation | Joachim Grillenberger et al., 2001, Materials Science Forum, 353-356, 475 |
| Authors | Joachim Grillenberger, N. Achtziger, G. Pasold, R. Sielemann, W. Witthuhn |
| Keywords | Band Offset, Deep Level, DLTS, Level Splitting, Polytype Dependence, Radiotracer, Tantalum, Tungsten |
| Price | US$ 28,- |
View full size
