Paper Title:
Structural and Electrical Characterization of Ion Beam Synthesized and n-Doped SiC Layers
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 353-356)
Edited by
G. Pensl, D. Stephani and M. Hundhausen
Pages
591-594
DOI
10.4028/www.scientific.net/MSF.353-356.591
Citation
C. Serre, D. Panknin, A. Pérez-Rodríguez, A. Romano-Rodríguez, J.R. Morante, R. Kögler, W. Skorupa, J. Esteve, M.C. Acero, "Structural and Electrical Characterization of Ion Beam Synthesized and n-Doped SiC Layers", Materials Science Forum, Vols. 353-356, pp. 591-594, 2001
Online since
January 2001
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Price
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