Paper Title:
Temperature Dependence of Forward and Reverse Characteristics of Ti, W, Ta and Ni Schottky Diodes on 4H-SiC
  Abstract

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Periodical
Materials Science Forum (Volumes 353-356)
Edited by
G. Pensl, D. Stephani and M. Hundhausen
Pages
679-682
DOI
10.4028/www.scientific.net/MSF.353-356.679
Citation
M. Treu, R. Rupp, H. Kapels, W. Bartsch, "Temperature Dependence of Forward and Reverse Characteristics of Ti, W, Ta and Ni Schottky Diodes on 4H-SiC", Materials Science Forum, Vols. 353-356, pp. 679-682, 2001
Online since
January 2001
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