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Current and Potential Uses of Positron Beams to Study Porosity in Low-k Dielectric Thin Films

Journal Materials Science Forum (Volumes 363 - 365)
Volume Positron Annihilation - ICPA-12
Edited by Werner Triftshäuser, Gottfried Kögel and Peter Sperr
Pages 15-19
DOI 10.4028/www.scientific.net/MSF.363-365.15
Citation K.P. Rodbell et al., 2001, Materials Science Forum, 363-365, 15
Authors K.P. Rodbell, M.P. Petkov, Marc H. Weber, Kelvin G. Lynn, W. Volksen, Robert D. Miller
Keywords Low Dielectric Constant Films, Porosity, Positron Beams, Positronium (Ps) Lifetime Distribution
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